quality | prompx

Industries

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Aerospace

From wing skins to turbine blades, PrompX delivers real-time Visual-Language AI that catches every flaw before first flight on your secure shop network.

  • Sub-50 µm defect detection at 99.95% recall
  • Edge inference in air-gapped DO-178C-aligned cells
  • Instant AS9102 FAIR report generation
Top use cases
Fuselage & Skin Surface InspectionTurbine Blade & Hot-Section AnalysisComposite Lay-up & Cure Verification

Automotive

Eliminate defects before they leave the line real-time AI for paint, body shop, and final assembly inside your plant.

  • ≤0.05 mm resolution at 99.9% precision
  • VIN-level traceability and recall readiness
  • Auto compliance reports (−70% prep time)
Top use cases
Paint & Surface InspectionWeld Quality VerificationAssembly & Torque Validation

Food & Beverage

Spot contaminants, label errors, and fill anomalies while auto-filling HACCP logs.

  • FO/particle detection to 0.2 mm at 99.9% accuracy
  • Real-time OCR for date codes & allergens
  • Auto HACCP/FSMA reports (−80% effort)
Top use cases
Fill-Level & Closure InspectionForeign Object DetectionLabel Accuracy & Allergen Verification

Electronics

Unify SPI, AOI, and X-ray catch every solder defect and trace anomaly before shipment.

  • Multimodal vision for 99.97% true-positive rate
  • Class 2/3 IPC conformance auto generated
  • Few-shot to new BOM in <30 min
Top use cases
Solder Paste & Pad InspectionPost-Reflow AOI & X-ray AnalysisComponent Presence, Polarity & OCR

Pharma

GMP-grade inspection that accelerates batch release and logs every action for compliance.

  • 50 µm particulate detection at 400 fps
  • OCR/OCV for labels, Braille, 2-D codes (99.99%)
  • Review-by-exception eBR (−60% release time)
Top use cases
Parenteral Vial InspectionBlister Pack IntegrityLabel & Carton Verification

Printing & Packaging

100% inline inspection from first sheet to finished pouch with one-click QA certificates.

  • ΔE < 1.0 colour control in real time
  • Seal width & glue pattern to 0.1 mm
  • Rapid changeover in <5 min
Top use cases
Colour & Register ControlVariable Data & Barcode VerificationDie-Cut & Crease Accuracy

Semiconductor

Unify wafer, reticle, and metrology data catch atomic-scale defects and drive yield in real time.

  • eBeam/optical/SEM fused 99.99% capture
  • KLARF & GDSII-aligned defect maps
  • New node in <24h with few-shot
Top use cases
Front-End Wafer InspectionOverlay & CD MetrologyPhotomask & Reticle Inspection

Textile

Guard every metre from loom to garment spotting defects, locking colour, and automating paperwork.

  • ΔE < 0.8 inline colour control
  • Pattern register ±0.2 mm
  • Roll-level digital twin & traceability
Top use cases
Loom-Side Fabric Defect DetectionDyeing & Finishing Colour ControlPrint Registration & Pattern Accuracy

Ready to unify QA on one platform?